Surface conditioning of conveyor materials or contact surfaces
AssigneeHemlock Semiconductor Corporation
InventorsJonathan Patrick Berrie, John Victor Bucci, James C. Mundell, Traig William Savage
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AssigneeHemlock Semiconductor Corporation
InventorsJonathan Patrick Berrie, John Victor Bucci, James C. Mundell, Traig William Savage
Estimating the term…
A method of reducing contamination in a silicon product includes: moving silicon pieces along a conveyance system, wherein the conveyance system comprises a liner having a polished surface finish with a surface roughness of less than or equal to 12 microinches; and moving the silicon pieces across the conveyance system, wherein the silicon pieces contain a reduced number of impurities as compared to silicon pieces in contact with a liner having an unpolished surface. A crushing tool includes: crushing tool elements configured to crush silicon into fragments, wherein the crushing tool elements comprise a surface comprising a polished surface finish with a surface roughness of less than or equal to 12 microinches. A conveyance system includes: a first conveyer discharged onto a second conveyer; wherein the first conveyer comprises a first liner and wherein the second conveyer comprises a second liner.
A method of reducing contamination in a silicon product, comprising:
A crushing tool, comprising:
A conveyance system, comprising:
Dependencies are inferred from the claim text.