Analysis apparatus and analysis system
AssigneeJtekt Corporation
InventorsHayato KOMATSU, Koichi Kato, Yoshiji Yamamoto
Life of this patent
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AssigneeJtekt Corporation
InventorsHayato KOMATSU, Koichi Kato, Yoshiji Yamamoto
Estimating the term…
To provide an analysis apparatus capable of improving the accuracy of analysis results. An analysis apparatus makes predictions about the quality of conditions of a production facility or the quality of conditions of a production object in a process of producing a crankshaft as the production object by a grinder as the production facility. The analysis apparatus includes the plurality of predictors making predictions about the quality by using different analysis methods based on data concerning the production facility, a selection unit selecting the plurality of predictors in use from the plurality of predictors, and an overall predictor calculating a comprehensive prediction result about the quality based on the plurality of prediction results obtained by the plurality of predictors in use selected by the selection unit.
An analysis apparatus making predictions about the quality of conditions of a production facility or the quality of conditions of a production object in a process of producing the production object by the production facility, comprising:
An analysis apparatus making predictions about the quality of conditions of a production facility or the quality of conditions of a production object in a process of producing the production object by the production facility, comprising:
Dependencies are inferred from the claim text.