US 2017/0219528 A1Published application

Method for non-destructive analysis of multiple structural parameters

AssigneeAtomic Energy of Canada Limited/éNergie Atomique Du Canada LimitéE

InventorsDag Horn, Brian A. Lepine, Jia Lei

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Abstract

A system and method for non-destructive analysis of a structure. A probe acquires a transient time based reference signal and at least one test signal. The reference signal and test signals are transformed to the frequency domain. The frequency domain test signal can be normalized using the frequency domain reference signal. Parameters of interest are evaluated at each test location by iteratively determining estimated parameter values, generating an estimated frequency domain test signal using the estimated parameter values and determining the convergence between the estimated frequency domain test signal and the normalized frequency domain test signal. The parameters values are determined as the estimated parameter values resulting in a maximized convergence between the estimated signal and the normalized test signal. The parameter values can be used to visualize and model various features of the structure.

Claims20

Dependent claims

A method for non-destructive analysis of a structure, the method comprising:

a) acquiring a transient time based continuous reference signal from a reference location on one of the structure and a calibration structure;
b) transforming the transient time based continuous reference signal to a frequency domain reference signal;
c) acquiring a transient time based continuous test signal from a test location on the structure;
d) transforming the transient time based continuous test signal to a frequency domain test signal;
e) identifying at least one parameter of interest of the structure at the test location;
and
f) evaluating a parameter value for each of the at least one parameter of interest by
i) determining an estimated parameter value for each of the at least one parameters;
ii) generating a frequency domain estimated signal for the test location using the estimated parameter values;
iii) determining a convergence between the estimated signal and the test signal;
iv) iteratively adjusting the estimated parameter values and generating an updated frequency domain estimated signal;
and
v) for each of the at least one parameters, determining the parameter value as the estimated parameter value for that parameter used to generate the estimated signal that results in a maximized convergence between the estimated signal and the test signal.

10 more elements

A system for non-destructive analysis of a structure, the system comprising:

a) a function generator for generating an interrogation waveform;
b) an interrogation unit coupled to the function generator, the interrogation unit including a signal transmitter and a sensor, wherein the signal transmitter is configured to
i) apply the interrogation waveform to a reference location on one of the structure and a calibration structure;
and
ii) apply the interrogation waveform to a test location on the structure;
and the sensor is configured to
i) acquire a transient time based continuous reference signal from the reference location;
and
ii) acquire a transient time based continuous test signal from the test location;
c) a processor coupled to the probe, the processor configured to
i) transform the transient time based continuous reference signal received from the sensor to a frequency domain reference signal;
ii) transform the transient time based continuous test signal received from the sensor to a frequency domain test signal;
iii)
iv) identify at least one parameter of interest of the structure at the test location;
and
v) evaluate a parameter value for each of the at least one parameters of interest by
a. determining an estimated parameter value for each of the at least one parameters;
b. generating a frequency domain estimated signal for the test location using the estimated parameter values;
c. determining a convergence between the estimated signal and the normalized test signal;
d. iteratively adjusting the estimated parameter values and generating an updated frequency domain estimated signal;
and
e. for each of the at least one parameters, determining the parameter value as the estimated parameter value for that parameter used to generate the estimated signal that results in a maximized convergence between the estimated signal and the normalized test signal;
and
d) a display coupled to the processor for displaying the determined parameter values of the structure.

21 more elements

Dependencies are inferred from the claim text.

Facts

Application: 15/420,864Filed 31 Jan 2017
Priority: 1 Feb 2016
Published: 3 Aug 2017
Term ends: Not estimatedThe source records don’t support an estimate.

Classification4 codes

G01N 27/9066
By analysing electrical signals: by measuring the propagation time, or delaying the signals
G01N 27/9046
Using eddy currents: by analysing electrical signals
G01N 27/9073
Using eddy currents: recording measured data
G01N
Investigating or analysing materials by determining their chemical or physical properties