Methods and Systems for Coherent Imaging and Feedback Control for Modification of Materials
AssigneeQueen's University at Kingston
InventorsPaul J.L. Webster, James M. Fraser, Victor X.D. Yang
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Abstract
Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
Claims31
An apparatus comprising:
- a material processing beam source that produces a material processing beam that is applied to at least one location of a material in a material modification process;
- an imaging optical source that produces imaging light;
- wherein the material processing beam and the imaging light share at least one optical element comprising a mirror;
- an optical interferometer that produces an interferometry output using at least a component of the imaging light that is delivered to the material, at least a component of the interferometry output simultaneously including reflections or the component of the imaging light from at least first and second optical path lengths to the material;
- the interferometry output based on a comparison at least two optical path lengths to the material, wherein the at least two optical path lengths are compared (i) to each other, or (ii) to another optical path length, or (iii) both (i) and (ii);
- a detector that receives the interferometry output and Produces a detector output that is indicative of a characteristic of the material before, during, or after the material modification process;
- and
- an image processor that receives the detector output and at least tracks material geometry to establish a reference optical path length to the material.
2-4. (canceled)
The apparatus of claim 123, wherein the feedback controller processes multiple instances of the detector output to identify a change in the detector output in respect of the material being processed, and wherein feedback control is a function of such change.
The apparatus of claim 123, wherein the feedback controller further generates an indication of optical index of the material based on the detector output.
The apparatus of claim 123, further comprising:
- a computer readable medium;
- wherein the record generator stores the at least one record on the computer readable medium.
The apparatus of claim 123, wherein the feedback controller is a real-time controller that controls the at least one processing parameter of the material modification process during said process.
12-14. (canceled)
The apparatus of claim 123, wherein the feedback controller performs an analysis based on the detector output and generates feedback control that controls depth of a phase change region.
The apparatus of claim 123, wherein the at least one processing parameter of the material modification process controlled by the feedback controller comprises at least one of:
- on/off state of the material processing beam;
- average power of the material processing beam;
- pulse duration of the material processing beam;
- peak intensity of the material processing beam;
- density of the material processing beam;
- energy of the material processing beam;
- particle species of the material processing beam;
- wavelength of the material processing beam;
- pulse repetition rate of the material processing beam;
- pulse energy of the material processing beam;
- pulse shape of the material processing beam
- scan speed of the material processing beam;
- focal diameter of the material processing beam;
- focal position of the material processing beam;
- spatial pattern of the material processing beam on the material;
- material feed rate;
- cooling media flow rate;
- cover/assist gas flow rate;
- cover/assist gas pressure;
- cover/assist gas blend;
- at least one arc welding process parameters selected from voltage, current, and wire feed rate;
- and
- additive material feed rate.
The apparatus of claim 123, wherein the feedback controller controls at least one material modification parameter based on at least one change sensed at a subsurface level based on the detector output.
(canceled)
28-49. (canceled)
A method for monitoring, controlling, or monitoring and controlling at least one processing parameter of a material modification process, the method comprising:
- generating imaging light with an imaging optical source;
- applying a material processing beam to a location of a material in the material modification process;
- wherein the material processing beam and the imaging light share at least one optical element comprising a mirror;
- producing an interferometry output using at least a component of the imaging light that is delivered to the material, at least a component of the interferometry output simultaneously including reflections of the component of the imaging light from at least first and second optical path lengths to the material;
- the interferometry output based on a comparison of at least two optical path lengths to the material, wherein the at least two optical path lengths are compared (i) to each other, or (ii) to another optical path length, or (iii) both (i) and (ii);
- detecting the interferometry output and producing a detector output that is indicative of a characteristic of the material before, during, or after the material modification process;
- and
- using the detector output to track material geometry and establish a reference optical path length to the material.
51-120. (canceled)
Dependencies are inferred from the claim text.