Image correction method and microscope

Abstract

An image correction method is provided in which, in order to capture images, a scanning beam is guided over an object plane by a beam-directing element, and at detection times a brightness value of a detection signal of an object location scanned at the respective detection time is detected in the object plane, wherein actual positions of the beam-directing element and the positions of the object locations which are associated with the actual positions are known at every detection time. A pixel array with known positions of each pixel of the pixel array is defined in the object plane, a number of pixels adjacent to the object location is acquired, and the brightness value which is detected at an object location is assigned proportionally to the adjacent pixels of the object location as brightness value portions. Also provided is a microscope designed to carry out the image correction method.

Dependencies are inferred from the claim text.