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AssigneeBionavis Ltd.
InventorsJanusz SADOWSKI, Niko GRANQVIST, Jussi TUPPURAINEN, Annika JOKINEN
Estimating the term…
A method for monitoring surface phenomena includes measuring a first surface plasmon resonance angle value (φSPR,REF) of a sample region (REG1), measuring a first critical angle value (φTIR,REF) of the sample region (REG1), causing a change of surface concentration (cM1,SRF) of an analyte (M1) at the sample region (REG1), changing the bulk composition at the sample region (REG1), measuring a second surface plasmon resonance angle value (φSPR(t)) of the sample region (REG1), measuring a second critical angle value (φTIR(t)) of the sample region (REG1), and determining an indicator value (φAUX(t)) indicative of the change of the surface concentration (cM1,SRF), wherein the indicator value (φAUX(t)) is determined from the second surface plasmon resonance angle value (φSPR(t)) by compensating an effect of the bulk composition, and wherein the magnitude (φCOMP) of said effect is determined by using the second critical angle value (φTIR(t)).
A method, comprising:
An apparatus comprising at least one processor, a memory including computer program code, the memory and the computer program code being configured to, with the at least one processor, cause the apparatus to perform at least the following:
(canceled)
A computer readable medium comprising computer program configured to, when executed by at least one processor, cause an apparatus to perform at least the following:
Dependencies are inferred from the claim text.