III-N SEMICONDUCTOR LAYER ON Si SUBSTRATE
AssigneeTranslucent, Inc.
InventorsRytis Dargis, Andrew Clark, Nam Pham, Erdem Arkun
Life of this patent
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Abstract
A method of growing III-N semiconducting material on a silicon substrate including the steps of growing a layer of epitaxial rare earth oxide on a single crystal silicon substrate and modifying the surface of the layer of epitaxial rare earth oxide with nitrogen plasma. The method further includes the steps of growing a layer of low temperature epitaxial gallium nitride on the modified surface of the layer of epitaxial rare earth oxide and growing a layer of bulk epitaxial III-N semiconductive material on the layer of low temperature epitaxial gallium nitride.
Claims8
1-13. (canceled)
A method of growing III-N semiconducting material on a silicon substrate comprising the steps of:
- providing a single crystal silicon substrate;
- epitaxially growing a first layer of rare earth oxide on the silicon substrate, the first layer of rare earth oxide being substantially lattice matched to the silicon substrate;
- epitaxially growing a second layer of rare earth oxide on the first layer of rare earth oxide, the second layer of rare earth oxide having a different lattice constant then the first layer of rare earth oxide creating a stress in the second layer of rare earth oxide;
- nitridizing the second layer of epitaxial rare earth oxide with nitrogen plasma to form a nucleation layer;
- epitaxially growing a nucleation-buffer layer of REN RE-III-N material on the nucleation layer of epitaxial rare earth oxide;
- and
- epitaxially growing a layer of III-N material on the nucleation-buffer layer of epitaxial rare earth oxide.
(canceled)
III-N semiconducting material on a silicon substrate comprising:
- a single crystal silicon substrate;
- a first epitaxial layer of rare earth oxide positioned on the silicon substrate, the first layer of rare earth oxide being substantially lattice matched to the silicon substrate;
- a second epitaxial layer of rare earth oxide positioned on the first epitaxial layer of rare earth oxide, the second epitaxial layer of rare earth oxide having a different lattice constant then the first epitaxial layer of rare earth oxide with a stress in the second epitaxial layer of rare earth oxide;
- the second layer of epitaxial rare earth oxide being nitridized with nitrogen to form a nucleation layer;
- and
- an epitaxial layer of III-N material positioned on the nucleation layer of epitaxial rare earth oxide.
III-N semiconducting material on a silicon substrate comprising:
- a single crystal silicon substrate;
- a single crystal layer of rare earth oxide positioned on the silicon substrate and having a surface;
- the surface of the single crystal layer of rare earth oxide being terminated with nitrogen atoms forming a nitrogen atom template;
- a single crystal layer of III-N material positioned on the nitrogen atom template;
- and
- a single crystal epitaxial bulk semiconductor III-N layer positioned on the single crystal layer of III-N material.
Dependencies are inferred from the claim text.