US 2017/0010643 A1 · TESTING METHOD AND ELECTRONIC DEVICE

Abstract

A testing method adapted for an electronic device operating an operating system at a particular temperature environment is provided. The method includes the steps of: determining whether an operating command is received; when the operating command is received, deriving a test, executing the test, and disabling a fan of the electronic device, wherein the test corresponds to one of a plurality of system states of an operating system, and includes a temperature threshold value corresponding to the system state and an entering action of the system state; and when the system state of the test corresponds to a work mode of the operating system, the test includes: continuously monitoring a temperature value of the central processing unit; and when the temperature value of the central processing unit reaches the temperature threshold value, enabling the fan and executing the entering action of the system state.

Claims16

Dependent claims

A testing method, adapted for an electronic device operating an operating system at a particular temperature environment, comprising:

determining whether an operating command is received;
deriving a test, executing the test, and disabling a fan of the electronic device when the operating command is received, wherein the test corresponds to one of a plurality of system states of the operating system, and comprises a temperature threshold value corresponding to the system state and an entering action of the system state,
wherein when the system state of the test corresponds to a work mode of the operating system, the test comprises:
continuously monitoring a temperature value of a central processing unit of the electronic device;
and
enabling the fan and executing the entering action of the system state when the temperature value of the central processing unit of the electronic device reaches the temperature threshold value.

3 more elements

An electronic device, comprising:

a central processing unit operating an operating system;
a fan fixed adjacent to the central processing unit;
a microcontroller coupled to the central processing unit and the fan;
wherein the microcontroller determines whether an operating command is received;
the microcontroller derives a test, executes the test, and disables the fan when the operating command is received, wherein the test corresponds to one of a plurality of system states of the operating system, and comprises a temperature threshold value corresponding to the system state and an entering action of the system state,
wherein when the system state of the test corresponds to a work mode of the operating system, the test comprises:
continuously monitoring a temperature value of the central processing unit of the electronic device;
and
enabling the fan and executing the entering action of the system state when the temperature value of the central processing unit of the electronic device reaches the temperature threshold value.

6 more elements

Dependencies are inferred from the claim text.

Testing method and electronic device

Life of this patent

Testing method and electronic device

Life of this patent

Abstract

Claims16