# US 2016/0258273 A1 · Determination of formation dip/azimuth with multicomponent induction data > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2016/0258273 A1 - Document ID: US20160258273A1 - Status: Published application - Kind: A1 - Application number: 14/427,914 - Filed: 2014-10-03 - Published: 2016-09-08 - Earliest claimed: 2013-10-04 - Assignees: Halliburton Energy Services, Inc. - Applicants: Halliburton Energy Services, Inc. - Inventors: Junsheng Hou; Dagang Wu; Burkay Donderici; Luis Emilio San Martin - Web page: https://patentgrep.com/patent/US20160258273A1 ## CPC - E21B 47/022: of the borehole, e.g. using geomagnetism - E21B 47/026: of penetrated ground layers - E21B 49/00: Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells - G01V 3/28: using induction coils - G01V 3/38: Processing data, e.g. for analysis, for interpretation, for correction - G01V 20/00: Geomodelling in general - E21B 47/024: of devices in the borehole (determining slope or direction of the borehole E21B47/022) - E21B 47/18: through the well fluid {, e.g. mud pressure pulse telemetry} - E21B: EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) ## Abstract The disclosure describes enhanced determination of dip and strike/azimuth for real-time MCI data processing in some difficult conditions such as low-dip and low-anisotropy formations using formation properties from surrounding layers. The method is effective for the enhanced determination of dip and azimuth to enhance the inversion accuracy of formation dip and azimuth if the formation anisotropic ratio is low and so reduce the uncertainty of the inverted dip and azimuth. ## Claims ### Claim 1 A method for measuring formation properties, the method comprising: obtaining a set of multicomponent induction data representing layers of downhole formations; performing inversion processing on the set of multicomponent induction data to determine a set of formation parameters for each of the layers; and updating at least a portion of the set of formation parameters for each of the layers based on formation anisotropic ratios of neighboring layers. ### Claim 2 (depends on 1) The method of claim 1, wherein the step of performing inversion processing includes performing a radially one-dimensional inversion or performing a zero-dimensional inversion. ### Claim 3 (depends on 2) The method of claim 2, wherein the inversion processing for each of the layers may be performed independently from other layers. ### Claim 4 (depends on 1) The method of claim 1, wherein the set of formation parameters represent at least one of a set of horizontal resistivity, a set of vertical resistivity, a set of dips, and a set of azimuths. ### Claim 5 (depends on 1) The method of claim 1, further comprising the step of generating a borehole correction log based on the determined set of formation parameters. ### Claim 6 (depends on 1) The method of claim 1, further comprising the step of calculating a set of quality indicators for the set of formation parameters. ### Claim 7 (depends on 1) The method of claim 1, wherein the step of updating at least a portion of the set of formation parameters includes renewing a formation dip parameter of a layer using formation dip parameters of neighboring layers. ### Claim 8 (depends on 1) The method of claim 1, wherein the step of updating at least a portion of the set of formation parameters includes renewing a formation azimuth parameter of a layer using formation dip parameters of neighboring layers. ### Claim 9 (depends on 1) The method of claim 1, wherein the step of updating at least a portion of the set of formation parameters includes renewing a formation dip parameter of a layer using formation anisotropic ratio parameters of neighboring layers. ### Claim 10 (depends on 1) The method of claim 1, wherein the step of updating at least a portion of the set of formation parameters includes renewing a formation azimuth parameter of a layer using formation anisotropic ratio parameters of neighboring layers. ### Claim 11 (depends on 1) The method of claim 1, wherein the step of updating at least a portion of the set of formation parameters is performed for a current layer in response to a determination that a formation anisotropic ratio or a formation dip of the current layer is lower than at least one of a neighboring layer's formation anisotropic ratio or a neighboring layer's formation dip. ### Claim 12 A logging system, comprising: a logging tool having a longitudinal tool axis and a perpendicular tool axis, the tool having an antenna arrangement that provides, as a function of tool position in a borehole, a set of multicomponent induction data representing layers of downhole formations; and at least one processor; and a memory device containing instructions that when executed by the at least one processor perform operations including: performing inversion processing on the set of multicomponent induction data to determine a set of formation parameters for each of the layers; and updating at least a portion of the set of formation parameters for each of the layers based on formation anisotropic ratios of neighboring layers. ### Claim 13 (depends on 12) The logging system of claim 12, wherein the inversion processing for each of the layers is performed independently from other layers. ### Claim 14 (depends on 12) The logging system of claim 12, wherein as part of performing the updating of at least a portion of the set of formation parameters, the at least one processor renews a formation dip parameter of a layer using formation dip parameters of neighboring layers. ### Claim 15 (depends on 12) The logging system of claim 12, wherein as part of performing the updating at least a portion of the set of formation parameters, the at least one processor renews a formation azimuth parameter of a layer using formation dip parameters of neighboring layers. ### Claim 16 (depends on 12) The logging system of claim 12, wherein as part of performing the updating at least a portion of the set of formation parameters, the at least one processor renews a formation azimuth parameter of a layer using formation anisotropic ratio parameters of neighboring layers. ### Claim 17 (depends on 12) The logging system of claim 12, wherein as part of performing the updating at least a portion of the set of formation parameters, the at least one processor renews a formation dip parameter of a layer using formation anisotropic ratio parameters of neighboring layers. ### Claim 18 (depends on 12) The logging system of claim 12, wherein the at least one processor updates at least a portion of the set of formation parameters for a current layer in response to a determination that a formation anisotropic ratio or a formation dip of the current layer is lower than at least one of a neighboring layer's formation anisotropic ratio or a neighboring layer's formation dip. ### Claim 19 (depends on 12) The logging system of claim 12, wherein the at least one processor further calculates a set of quality indicators for the set of formation parameters. ### Claim 20 An apparatus for measuring formation properties, comprising: a computing device, including, a display and a user interface, one or more processors, the one or more processors coupled to the display, and one or more memory devices coupled to the processors; and one or more programs stored in one or more of the memory devices, the one or more programs comprising instructions to cause the one or more processors to, obtain a set of multicomponent induction data representing layers of downhole formations; perform inversion processing on the set of multicomponent induction data to determine a set of formation parameters for each of the layers; and update at least a portion of the set of formation parameters for each of the layers based on formation anisotropic ratios of neighboring layers.