A method for operating a thin-film transistor based sensing device, said sensing device comprising a flexible substrate, a first metallization layer forming at least a source region and at least a drain region, a piezoelectric thin film layer providing a channel region permitting passage of charge carriers between said source region and said drain region, a second metallization layer forming at least a gate electrode, an insulating layer disposed intermediate said second metallization layer and said piezoelectric thin film layer, said method comprising:
- providing a biasing voltage across said source and said drain regions,
- providing a control voltage to the gate electrode for regulating a flow of charge carriers between said source and said drain regions through said piezoelectric thin film layer,
- determining modulation of said flow of charge carriers in response to a strain in said piezoelectric thin film layer, and
- determining an applied force provided to said sensing device based on a correlation between said applied force and resulting modulation of said flow of charge carriers.