Automatic calibration of thermal models
AssigneeMentor Graphics Corporation
InventorsByron Blackmore, Robin Bornoff
Life of this patent
Estimating the term…
Abstract
Techniques for calibrating thermal models are disclosed. A plurality of thermal model parameter value sets for a structure are first determined. Using the plurality of thermal model parameter value sets, thermal transient response simulations are performed to obtain a plurality of simulation results. Each of the plurality of simulation results is derived based on one of the plurality of thermal model parameter value sets. Based on the plurality of simulation results and an experimental result obtained from a thermal transient response measurement of the structure, calibrated thermal model parameter values for the structure are computed.
Claims20
A method, executed by at least one processor of a computer, comprising:
- determining a plurality of thermal model parameter value sets for a structure, each of the plurality of thermal model parameter value sets consisting of preliminary values for a set of thermal model parameters, the structure including at least one microelectronic device;
- performing thermal transient response simulations using the plurality of thermal model parameter value sets to obtain a plurality of simulation results, each of the plurality of simulation results being derived based on one of the plurality of thermal model parameter value sets;
- and
- computing calibrated thermal model parameter values for the structure based on the plurality of simulation results and an experimental result obtained from a thermal transient response measurement of the structure.
One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
- determining a plurality of thermal model parameter value sets for a structure, each of the plurality of thermal model parameter value sets consisting of preliminary values for a set of thermal model parameters, the structure including at least one microelectronic device;
- performing thermal transient response simulations using the plurality of thermal model parameter value sets to obtain a plurality of simulation results, each of the plurality of simulation results being derived based on one of the plurality of thermal model parameter value sets;
- and
- computing calibrated thermal model parameter values for the structure based on the plurality of simulation results and an experimental result obtained from a thermal transient response measurement of the structure.
A system, comprising:
- one or more processors, the one or more processors programmed to perform a method, the method comprising:
- determining a plurality of thermal model parameter value sets for a structure, each of the plurality of thermal model parameter value sets consisting of preliminary values for a set of thermal model parameters, the structure including at least one microelectronic device;
- performing thermal transient response simulations using the plurality of thermal model parameter value sets to obtain a plurality of simulation results, each of the plurality of simulation results being derived based on one of the plurality of thermal model parameter value sets;
- and
- computing calibrated thermal model parameter values for the structure based on the plurality of simulation results and an experimental result obtained from a thermal transient response measurement of the structure.
Dependencies are inferred from the claim text.