Fault detection apparatus and method
AssigneeFreescale Semiconductor, Inc.
InventorsGRAHAM EDMISTON, ALAN DEVINE, DAVID MCMENAMIN, ANDREW ROBERSTON, JAMES ANDREW COLLIER SCOBIE
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Abstract
Apparatus suitable for detecting a fault in a processor comprises a monitor which receives input and output signals from the processor and generates a hash index key which is used to access entries in a hash table. The entries may include actions such as setting a timer so that the response of an output to a change of state of an input may be confirmed as valid within a specified time interval.
Claims13
A method for detecting a fault in a device, the method comprising;
- receiving from the device, a first signal to be monitored, said first signal to be monitored having a value, generating a first hash index key for the first signal to be monitored, searching, using said generated first hash index key, a hash table for an entry matching the value of the received first signal, and if a matching entry is not found, completing a first action and if a matching entry is found, completing a second action associated with the found matching entry.
Fault detection apparatus for detecting a fault in a device, said apparatus comprising a hash table, and wherein the fault detection apparatus is arranged to receive from the device, a signal to be monitored, said signal to be monitored having a value, generate a hash index key for the signal to be monitored, search, using said generated first hash index key, the hash table for an entry matching the value of the received signal, and if a matching entry is not found, complete a first action and if a matching entry is found, complete a second action associated with the found matching entry.
Dependencies are inferred from the claim text.