Persistent command parameter table for pre-silicon device testing

A computer program product for implementing pre-silicon device testing using a persistent command table, the computer program product comprising:

• a computer readable storage medium having program instructions embodied therewith, the program instructions readable by a processing circuit to cause the processing circuit to perform a method comprising:
• receiving a value for a persistent command parameter from a user;
• determining whether the value of the persistent command parameter is greater than zero;
• based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test;
• adding the selected commands to the persistent command table of the driver;
• and
• performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.

A computer system for pre-silicon device testing using a persistent command table, the system comprising:

• a memory;
• and
• a processor, communicatively coupled to said memory, the computer system configured to perform a method comprising:
• receiving a value for a persistent command parameter from a user;
• determining whether the value of the persistent command parameter is greater than zero;
• based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test;
• adding the selected commands to the persistent command table of the driver;
• and
• performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.