Method for auto-calibrating semiconductor component tester

A method for auto-calibrating a semiconductor component tester, the tester being used for testing at least one semiconductor component with at least one device under test, the tester comprising at least one board slot for receiving a channel board therein, each channel board comprising at least one test channel, the method comprising steps of:

• (A) detecting a calibration board in the board slot to acquire an initial tester setting value of the tester and an initial board setting value of the channel board, and recording the initial tester setting value of the tester and the initial board setting value of the channel board;
• and
• (B) testing the semiconductor component to acquire a test record of the tested semiconductor component, a test timing/frequency of the tested semiconductor component and a tester parameter of the tester and a board parameter of the channel board for the tested semiconductor component, wherein if the semiconductor component fails the test, the semiconductor component is tested again according to the tester parameter and the board parameter corresponding to the previously-passed semiconductor component.