Collecting diagnostic data from chips
AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Ryan A. Fitch, William V. Huott, Mary P. Kusko
Life of this patent
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Abstract
A failing latch is identified on a chip including a plurality of latches with the failing latch receiving data propagated from a first set of test input latches. A diagnostic set of latches is determined which includes the failing latch and a set of related latches. The set of related latches each receives data propagated from at least one test input latch from the first set of test input latches. The set of related latches is identified from a related latches table. One or more tests are performed on the chip and test output data is collected from the diagnostic set of latches. The related latches table is created by tracing from a target latch.
Claims5
A method for creating a related latches table for a chip including a plurality of latches, the method comprising:
- selecting a target latch from the plurality of latches;
- tracing data input from the target latch back to a first set of source latches;
- tracing data propagation from the first set of source latches to a set of sink latches, the set of sink latches consisting of the target latch and related latches;
- and
- recording the related latches in the related latches table for the target latch.
Dependencies are inferred from the claim text.