Detecting method for improving resolution of area array probe

A detection method capable of improving a resolution of an area array probe, comprising the following steps:

• step 1, an ultrasonic area array probe is provided with N wafers that are arranged in the form of an area array, wherein N represents the number of the wafers;
• step 2, a chip controls a wafer a to emit impulse waves to a workpiece to be detected for m times, wherein a represents the ath wafer and m represents the times of emitting impulses;
• step 3, the impulse waves reflected by the workpiece to be detected are successively received by the wafer a and (m−1) wafers adjacent to the wafer a, respectively;
• step 4, all the N wafers emit impulse waves for m times successively, and the impulse waves reflected by the workpiece to be detected are received;
• step 5, the process of the step 1 to the step 4 is repeated until defect detection is finished;
• and
• step 6, a host analytically processes the received impulse waves to obtain a defect graph of the workpiece to be detected, and the defect graph is displayed through a display of the host.