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US 2016/0238534 A1Published application
System and method for detecting a defect in a structure member
AssigneeCity University of Hong Kong
InventorsDenvid Lau, Tin Kei Cheng
Life of this patent
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Abstract
A method for detecting a defect in a structure member includes exciting a structure member by applying an excitation signal to the structure member, applying an optical signal to the excited structure member and capturing a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member, and processing the reflected optical signal to determine one or more defects in the structure member.
Claims39
A method for detecting a defect in a structure member comprising the steps of:
- exciting a structure member by applying an excitation signal to the structure member;
- applying an optical signal to the excited structure member and capturing a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member;
- and
- processing the reflected optical signal to determine one or more defects in the structure member.
1 more element
A system for detecting a defect in a structure member comprising:
- an excitation device arranged to excite a structure member by applying an excitation signal to the structure member;
- a light source arranged to apply an optical signal to the excited structure member;
- an optical receiver arranged to capture a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member;
- and
- a processor arranged to process the reflected optical signal to determine one or more defects in the structure member.
2 more elements
Dependencies are inferred from the claim text.