System and method for providing active refraction feedback for devices with variable index of refraction
AssigneeRaytheon Company
InventorsSean D. Keller, Gerald P. Uyeno
Life of this patent
Estimating the term…
Abstract
A system for providing active refraction feedback for devices with a variable index of refraction includes a reference beam generator and an altered reference beam sensor. The reference beam generator is configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device. The VIR device is configured to generate an altered reference beam based on the reference beam and based on an index of refraction for the VIR device. The altered reference beam sensor is configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction.
Claims20
A system, comprising:
- a reference beam generator configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to generate an altered reference beam based on the reference beam and based on an index of refraction for the VIR device;
- and
- an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction.
A system, comprising:
- a reference beam generator configured to generate a reference beam and to apply the reference beam to a VIR device, wherein the VIR device is configured to generate an altered reference beam based on the reference beam and to steer an input beam of light to generate a steered beam at a steered angle;
- an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam related to an actual index of refraction corresponding to the steered angle;
- and
- a voltage adjuster configured to determine the actual index of refraction based on the sensed characteristic.
A method, comprising:
- applying a reference beam to a VIR device, wherein the VIR device is configured to generate an altered reference beam based on the reference beam and based on an actual index of refraction for the VIR device;
- detecting the altered reference beam;
- and
- sensing a characteristic of the altered reference beam corresponding to the actual index of refraction.
Dependencies are inferred from the claim text.