Euv light source and exposure apparatus
AssigneeSemiconductor Manufacturing International (Shanghai) Corporation
InventorsQIANG WU, LIWAN YUE
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AssigneeSemiconductor Manufacturing International (Shanghai) Corporation
InventorsQIANG WU, LIWAN YUE
Estimating the term…
An extreme ultraviolet (EUV) light source is provided. The EUV light source comprises a spray nozzle array having a plurality of spray nozzles configured to spray a plurality of rows of droplets to an irradiating position. The EUV light source also includes a laser source having a first reflective mirror and a second reflective mirror configured to generate a first laser beam and a second laser beam, and to cause the first laser beam and the second laser beam to sequentially bombard the plurality of droplets arriving at the irritating position to generate EUV light with increased output power. Further, the EUV light source includes a light focusing device a light focusing device comprising a first partial focusing mirror and a second partial focusing mirror configured to perform a rotating scanning to collect EUV light and focus the collected EUV light at a central focusing point.
An extreme ultraviolet (EUV) light source, comprising:
A method for generating EUV light, comprising:
An exposure apparatus, comprising:
Dependencies are inferred from the claim text.