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US 2016/0112700 A1Published application
Circuit and method for on-chip testing of a pixel array
AssigneeSTMicroelectronics (Grenoble 2) SAS
InventorsRichun Fei, Salvador Mir, Jocelyn Moreau
Life of this patent
Estimating the term…
Abstract
Testing of control wires of a pixel array of an image sensor is performed by applying a signal transition to a control wire and detecting, based on a voltage signal detected on the control wire, the duration of at least part of the signal transition on the control wire. An electrical fault in the control wire is indicated based on a comparison of the detected duration to a threshold.
Claims22
A method, comprising:
- applying a signal transition to a control wire of a pixel array of an image sensor;
- detecting, based on a voltage signal detected on the control wire, a duration of at least part of a signal transition on the control wire;
- and
- detecting an electrical fault in the control wire based on the detected duration.
1 more element
A circuit, comprising:
- a control circuit configured to apply a signal transition to a control wire of a pixel array of an image sensor;
- and
- a fault detection circuit coupled to the control wire and configured to:
- determine the duration of at least part of the signal transition on the control wire;
- and
- detect an electrical fault in the control wire based on the detected duration.
3 more elements
A system, comprising:
- a plurality of testing circuits, each testing circuit coupled to a corresponding one of a plurality of control wires, wherein each testing circuit comprises:
- a control circuit configured to apply a signal transition to a control wire of a pixel array of an image sensor;
- and
- a fault detection circuit coupled to the control wire and configured to:
- determine the duration of at least part of the signal transition on the control wire;
- and
- detect an electrical fault in the control wire based on the detected duration;
- and
- a plurality of synchronous devices configured to compare the detected durations with reference durations, wherein the synchronous devices are configured to be daisy-chained to output the result of the comparison for each of the plurality of control wires.
6 more elements
Dependencies are inferred from the claim text.