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US 2016/0112224 A1Published application
Determining a representation of an electrical signal
AssigneeImage Processing Techniques Limited
InventorsAlex HUNTLEY, Roger FAWCETT
Life of this patent
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AssigneeImage Processing Techniques Limited
InventorsAlex HUNTLEY, Roger FAWCETT
Estimating the term…
The invention relates to a method, systems, computer program, and computer-readable medium for reducing artefacts (speckling) which may appear to be noise/errors in a representation of an electrical signal. An Eye Pattern representation of a digital bit stream signal can be used for determining a range of signal quality characteristics, and can be generated from measurements of the proportion of ones and zeroes detected when sampling the signal at both at a reference data sampling position within a bit period and at a range of offset sampling positions. However, the speckling noise which typically exists in such an Eye Pattern reduces the confidence that can be placed in values for different signal characteristics which may be determined from the Eye Pattern. While speckling may be reduced by increasing the sampling frequency used to sample the signal, the present invention reduces speckling by using data gathered at the reference data sampling point to correct data gathered at each of the offset sampling positions. Thereby, the invention reduces the number of samples needed in order to reduce speckling to a particular level.
A method of generating a representation of an electrical signal, the method comprising:
A system comprising at least one processor arranged to:
(canceled)
A non-transitory computer-readable medium storing instructions which when executed by one or more processors cause the one or more processors to:
A system for generating Eye Patterns that, for each of a plurality of offset sampling positions spanning at least part of the range of voltages comprised in a serial data bit stream signal and spanning at least part of a bit period of the signal, substantially simultaneously measures a proportion of samples of the signal which meet or exceed the voltage of the respective offset sampling position and measures a proportion of the samples which meet or exceed a voltage of a reference sampling position which is substantially in the centre of the bit period, wherein the system uses the respective proportion measured at the reference sampling position to correct the respective proportion measured at each offset sampling position, which respective corrected proportion is then combined with similarly corrected proportions for others of the plurality of offset sampling positions to derive an Eye Pattern representation of the signal.
Dependencies are inferred from the claim text.