Low-cost test/calibration system and calibrated device for low-cost test/calibration system
AssigneeMediatek Inc.
InventorsJen-Yang LIU, I-Cheng TSAI, Hsueh-Wei CHIU, Yuan-Hwui CHUNG, Chun-Hsien PENG
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Abstract
A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.
Claims18
A calibrated device, transmitting or receiving a test signal to or from a device under test (DUT) in response to a test item to test, measure or calibrate functioning or performance of an internal component of the DUT, comprising:
- a chip, comprising:
- at least one of an analog signal processing circuit and a baseband signal processing circuit;
- and
- a memory device, coupled to at least one of the analog signal processing circuit and the baseband signal processing circuit;
- and
- at least one external component, outside of the chip, processing the received test signal and transmit the processed signal to the chip for test result generation purpose, or receiving a signal from the chip and processing the signal to generate the test signal to be transmitted to the DUT;
- wherein the external component and/or the chip have been calibrated.
A system, comprising:
- a device under test (DUT);
- and
- a calibrated device, coupled to the DUT, transmitting or receiving a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.
Dependencies are inferred from the claim text.