Semiconductor device, manufacturing method thereof, display device, and display module
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei YAMAZAKI
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei YAMAZAKI
Estimating the term…
A semiconductor device including an oxide semiconductor film in which a change in electrical characteristics is inhibited and which has improved reliability is provided. The semiconductor device includes a gate electrode, a first insulating film over the gate electrode, an oxide semiconductor film over the first insulating film, a source electrode electrically connected to the oxide semiconductor film, a drain electrode electrically connected to the oxide semiconductor film, and a second insulating film over the oxide semiconductor film, the source electrode, and the drain electrode. The second insulating film includes a region including a halogen element, and the halogen element is distributed in the region at a higher concentration toward a surface of the second insulating film.
A semiconductor device comprising:
A display module comprising:
A semiconductor device comprising:
A method for manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.