Method of manufacturing semiconductor device, semiconductor device and substrate processing apparatus
AssigneeHitachi Kokusai Electric Inc.
InventorsNorikazu MIZUNO, Tomohide KATO, Takaaki NODA
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AssigneeHitachi Kokusai Electric Inc.
InventorsNorikazu MIZUNO, Tomohide KATO, Takaaki NODA
Estimating the term…
An oxide film capable of suppressing reflection of a lens is formed under a low temperature. A method of manufacturing a semiconductor device includes (a) forming a lower layer oxide film on a lens formed on a substrate using a first processing source containing a first element, a second processing source containing a second element, an oxidizing source and a catalyst, the lower layer oxide film having a refractive index greater than that of air and less than that of the lens; and (b) forming an upper layer oxide film on the lower layer oxide film using the first processing source, the oxidizing source and the catalyst, the upper layer oxide film having a refractive index greater than that of the air and less than that of the lower layer oxide film.
A method of manufacturing a semiconductor device, comprising forming a metal-containing oxide film on a substrate by performing a cycle a predetermined number of times, the cycle comprising:
A substrate processing apparatus including:
Dependencies are inferred from the claim text.