Apparatuses and methods for reducing read disturb
AssigneeMicron Technology, Inc.
InventorsFeng Pan, Ramin Ghodsi, Qiang Tang
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AssigneeMicron Technology, Inc.
InventorsFeng Pan, Ramin Ghodsi, Qiang Tang
Estimating the term…
Apparatuses and methods for reducing read disturb are described herein. An example apparatus may include a first memory subblock including a first select gate drain (SGD) switch and a first select gate source (SGS) switch, a second memory subblock including a second SGD switch and a second SGS switch, and an access line associated with the first and second memory subblocks. The apparatus may include a control unit configured to enable the first and second SGD switches and the first and second SGS switches during a first portion of a read operation and to provide a first voltage on the access line during the first portion. The control unit may be configured to disable the first SGD switch and the first SGS switches during a second portion of the read operation and to provide a second voltage on the access line during the second portion.
An apparatus, comprising:
An apparatus, comprising:
A method, comprising:
A method, comprising:
A method, comprising:
Dependencies are inferred from the claim text.