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US 2016/0110237 A1Published application
Method to determine ber (bit error rate) from an eye diagram
AssigneeTektronix, Inc.
InventorRichard J. Poulo
Life of this patent
Estimating the term…
Abstract
A system and method for calculating a bit error rate for a mask is described. For each time during the time duration of the mask, the minimum and maximum voltages of the mask at that time are determined. The maximum bit error rate can be calculated for each time by integrating between those voltages. The maximum bit error rate for all times during the time duration of the mask can be selected as the maximum bit error rate for the mask.
Claims25
A system, comprising:
- a test and measurement instrument;
- a memory in the test and measurement instrument capable of storing a probability distribution function for an eye diagram;
- an extrema unit to determine a minimum voltage and a maximum voltage for a mask in the eye diagram at each time during a time duration of the mask in the eye diagram, the mask having the pre-determined time duration and a pre-determined voltage range;
- a sum unit to calculate a BER at each time from the PDF using the minimum voltage and the maximum voltage at each time during the time duration of the mask in the eye diagram;
- and
- a mask BER unit to determine a BER for the mask in the eye diagram from the BER at each time during the time duration of the mask in the eye diagram.
3 more elements
A method for determining a bit error rate for a mask in an eye diagram, comprising:
- receiving a probability distribution function for an eye diagram;
- at each time during a time duration of a mask in the eye diagram, the mask having the pre-determined time duration and a pre-determined voltage range, determining a minimum voltage of the mask in the eye diagram at that time and a maximum voltage of the mask in the eye diagram at that time;
- at each time during the time duration of the mask in the eye diagram, calculating, using a test and measurement instrument, a BER as a sum of the PDF from the minimum voltage at that time to the maximum voltage at that time;
- and
- determining, using the test and measurement instrument, a BER for the mask in the eye diagram as a maximum of all BERs at each time during the time duration of the mask in the eye diagram.
2 more elements
Dependencies are inferred from the claim text.