Method with function parameter setting and integrated circuit using the same
AssigneeuPI Semiconductor Corp.
InventorChih-Lien Chang
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AssigneeuPI Semiconductor Corp.
InventorChih-Lien Chang
Estimating the term…
A method with function parameter setting and an integrated circuit using the same are provided. The integrated circuit includes a function pin coupled to an external setting unit, a switch unit, and first and second function adjustment circuits. The first function adjustment circuit includes first and second current sources. The second function adjustment circuit detects a percentage of a divided voltage at the function pin, to provide a reference value and to set a second function parameter. The first function adjustment circuit uses the first current source to detect a first voltage detecting value at the function pin, and compares the first voltage detecting value with a default value. The switch unit switches the first and second current sources according to a compare result. The present invention adopts an integrated circuit for switching a plurality of current sources and detections, and may determine more resistance value setting intervals.
An integrated circuit with function parameter setting, coupled to an external setting unit, the integrated circuit comprising:
An integrated circuit with function parameter setting, coupled to an external setting unit, the integrated circuit comprising:
A method with function parameter setting, adapted to an integrated circuit, wherein the integrated circuit has a function pin, and the function pin is coupled to an external setting unit and a switch unit, the method with function parameter setting comprising:
A method with function parameter setting, adapted to an integrated circuit, wherein the integrated circuit has a function pin, and the function pin is coupled to an external setting unit and a switch unit, the method with function parameter setting comprising:
Dependencies are inferred from the claim text.