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US 2016/0109610 A1Published application
High resolution downhole flaw detection using pattern matching
AssigneeHalliburton Energy Services, Inc.
InventorBURKAY DONDERICI
Life of this patent
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Abstract
An example method for downhole surveying and measuring may include positioning a first conformable sensor proximate to a downhole element. The first conformable sensor may include a flexible material, a transmitter coupled to the flexible material, and a receiver coupled to the flexible material. A response of the downhole element to a signal generated by the transmitter may be measured at the receiver. The response may be processed to determine a feature of the downhole element.
Claims20
A method for downhole surveying and measuring, comprising
- positioning a first conformable sensor proximate to a downhole element, the first conformable sensor including
- a flexible material;
- a transmitter coupled to the flexible material;
- and
- a receiver coupled to the flexible material;
- measuring at the receiver a response of the downhole element to a signal generated by the transmitter;
- and
- processing the response to determine a feature of the downhole element.
5 more elements
A system for downhole surveying and measuring, comprising
- a conformable sensor coupled to a downhole tool, the conformable sensor comprising
- a flexible material;
- a transmitter coupled to the flexible material;
- and
- a receiver coupled to the flexible material;
- a processor communicably coupled to the downhole tool, wherein the processor is coupled to a memory device containing a set of instructions that, when executed by the processor, causes the processor to
- receive from the receiver a response of the downhole element to a signal generated by the transmitter;
- and
- process the response with a reference measurement set to determine a feature of the downhole element.
6 more elements
Dependencies are inferred from the claim text.