Test path compensating circuit and test path compensating system
AssigneeSK hynix Inc.
InventorSeong Ju LEE
Life of this patent
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Abstract
A test path compensating circuit may include a plurality of electrical paths electrically coupling a plurality of test pads to a test target circuit. The test path compensating circuit may include a control voltage generation circuit configured to generate a plurality of control voltages. The test path compensating circuit may include a plurality of voltage-control delay circuits electrically coupled to the plurality of electrical paths, respectively, and configured to control delay amounts of input test signals received from one or more of the plurality of test pads, based on one or more of the plurality of control voltages, and provide output test signals to the test target circuit.
Claims20
A test path compensating circuit comprising:
- a plurality of electrical paths electrically coupling a plurality of test pads to a test target circuit;
- a control voltage generation circuit configured to generate a plurality of control voltages;
- and
- a plurality of voltage-control delay circuits electrically coupled to the plurality of electrical paths, respectively, and configured to linearly control delay amounts of input test signals received from one or more of the plurality of test pads, based on one or more of the plurality of control voltages, and provide output test signals to the test target circuit.
A test path compensating system comprising:
- test equipment configured to provide input test signals and an external control signal;
- and
- a test path compensating circuit configured to receive the input test signals through a plurality of test pads, linearly control delay amounts of the input test signals, based a plurality of control voltages generated based on the external control signal, and provide the input test signals as output test signals.
The test path compensating system according to claim 11,
- wherein the test path compensating circuit comprises a test target circuit configured for receiving the output test signals, and
- wherein the test equipment determines whether the test target circuit operates normally, through signals outputted from the test target circuit.
A test path compensating circuit comprising:
- a plurality of electrical paths electrically coupling a plurality of test pads to a test target circuit;
- and
- a plurality of voltage-control delay circuits electrically coupled to the plurality of electrical paths, respectively, and configured to control delay amounts of input test signals received from one or more of the plurality of test pads, based on differences in the electrical paths extending from test pads to the test target circuit.
The test path compensating circuit according to claim 18, wherein the differences include process, voltage and temperature differences of the plurality of electrical paths.
Dependencies are inferred from the claim text.