Apparatus for the thermal testing of electronic devices and corresponding method
AssigneeSTMicroelectronics S.r.l.
InventorsDavide APPELLO, Giorgio POLLACCIA, Antonio GIAMBARTINO
Life of this patent
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Abstract
An apparatus for the thermal testing of electronic devices may include a universal base board for coupling to an electronic driver unit for receiving electrical signals therefrom, and a plurality of test boards arranged on the base board. Each test board may include a holder for receiving a device under test and routing thereto electrical signals from the electronic driver unit as well as an adaptation board to the base board. Each test board may include a respective electrically powered heating element for heating the electronic device received thereat.
Claims21
1-10. (canceled)
An apparatus for thermal testing electronic devices comprising:
- a base board to be coupled to an electronic driver unit and configured to receive electrical signals therefrom;
- and
- a plurality of test boards carried by said base board, each of said plurality of test boards being configured to receive at least one of the electronic devices under test and route the electrical signals from the electrical driver unit to the at least one electronic device under test, each of said plurality of test boards also including a respective electrically powered heating element for heating the at least one electronic device under test received thereat.
A thermal testing apparatus comprising:
- a base board;
- and
- a plurality of test boards carried by said base board, each of said plurality of test boards being configured to receive at least one device under test and permit communication between an electrical driver unit and the at least one device under test, each of said plurality of test boards also including a respective electrically powered heating element for heating the at least one device under test.
A method of thermal testing electronic devices using an apparatus comprising a base board, a plurality of test boards carried by the base board, each of the plurality of test boards being configured to receive a respective one of the electronic devices to be thermally tested, and each of the plurality of test boards also including a respective electrically powered heating element, the method comprising:
- locating the electronic devices to be tested at the test boards;
- coupling the base board to an the electronic driver unit to receive electrical signals therefrom and route the electrical signals to the electronic devices;
- and
- feeding electrical power to the electrically powered heating elements to heat the electronic devices.
A method of making a thermal testing apparatus comprising:
- forming a plurality of test boards, each of the plurality of test boards for receiving at least one device under test and permitting communication between an electrical driver unit and the at least one device under test, forming the plurality of test boards comprising forming, for each of the plurality of test boards also, a respective electrically powered heating element for heating the at least one device under test;
- and
- coupling the plurality of test boards to a base board.
Dependencies are inferred from the claim text.