Method for predicting failure of a light-emitting diode
AssigneeCommissariat A L'energie Atomique Et Aux Energies Alternatives
InventorBenoit HAMON
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Abstract
A method for predicting failure of a light-emitting diode, includes applying a test potential difference across the terminals of the light-emitting diode lower than its minimum drive potential difference, the test potential difference having the same sign as the minimum drive potential difference; measuring the current Ic flowing through the light-emitting diode during the application of the test potential difference; and generating an alarm signal when the measured current Ic exceeds an alarm threshold Ia.
Claims10
A method for predicting failure of a light-emitting diode, comprising:
- applying a test potential difference across the terminals of the light-emitting diode lower than its minimum drive potential difference, said test potential difference having the same sign as the minimum drive potential difference of the light-emitting diode;
- measuring the current Ic flowing through the light-emitting diode during the application of said test potential difference;
- and
- generating an alarm signal when the measured current Ic exceeds an alarm threshold Ia.
A lighting device, comprising:
- a light-emitting diode;
- an electrical power supply connected across the terminals of the light-emitting diode and capable of applying selectively across said terminals, depending on a control signal, a potential difference higher than the minimum drive potential difference of the light-emitting diode or a test potential difference lower than the minimum drive potential difference of the light-emitting diode, said test potential difference having the same sign as the minimum drive potential difference;
- a circuit for measuring the current between the terminals of the light-emitting diode;
- and
- a circuit configured to generate a control signal controlling the application of said test potential difference by the electrical power supply, and configured to generate an alarm signal when the measured current between the terminals of the light-emitting diode for said test potential difference exceeds an alarm threshold.
Dependencies are inferred from the claim text.