Measurement method and measurement system

A measurement system comprising:

• a processor configured to perform a measurement program;
• a memory configured to store the measurement program;
• and
• an interface configured to mediate an input and an output of data with a measurement device,
• wherein the processor, based on the measurement program,
• obtains a first temperature characteristic of the crystal oscillator based on a plurality of oscillating frequencies observed when the crystal oscillator is temporarily energized at each of a plurality of temperatures around the crystal oscillator,
• observes a first oscillating frequency obtained by maintaining energization of the crystal oscillator after setting the temperature around the crystal oscillator to a first temperature of the plurality of temperatures,
• obtains a second temperature characteristic of an oscillating frequency when energization of the crystal oscillator is maintained based on the first temperature characteristic and the first oscillating frequency, and
• normalizes the first temperature characteristic at a given temperature.