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US 2016/0109358 A1Published application
Method for detecting and analzying surface films
AssigneeOrthobond, Inc.
InventorsJordan Katz, Abe Belkind, Randy Clevenger
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Abstract
Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data.
Claims32
A method of analyzing a film comprising:
- contacting the film with plasma to produce spectral lines;
- and
- analyzing the spectral lines.
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A method of analyzing a film comprising:
- placing a film-coated substrate into a chamber;
- adding plasma to the chamber;
- recording spectral data produced after addition of the plasma;
- and
- analyzing the spectral data.
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A system of analyzing a film comprising:
- a film;
- a plasma;
- and
- a spectral data recording device.
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Dependencies are inferred from the claim text.