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AssigneeIndustry-University Cooperation Foundation Hanyang University
InventorsJong-IL PARK, Moon-Hyun LEE, Byung-Kuk SEO
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Disclosed are a method for obtaining a full reflectance spectrum of a surface and an apparatus therefor. The method for obtaining a full reflectance spectrum of a surface, comprises the steps of: (a) calculating a combination value of spectral characteristics of a light source and response characteristics of a camera for an image of a reference object, the full reflectance spectrum of a surface of which is known, by utilizing the known full reflectance spectrum of a surface; (b) obtaining an image by photographing an object irradiated with light according to a predetermined lighting environment; and (c) obtaining a full reflectance spectrum of a surface for the object by utilizing the combination value of the spectral characteristics of the light source and the response characteristics of the camera for the image.
A full reflectance spectrum of a surface obtainment method comprising:
A calibration apparatus for obtaining a full reflectance spectrum of a surface, the calibration apparatus comprising:
A method of obtaining images in a calibration apparatus, the calibration apparatus comprising an image obtainment unit having a lighting device and a camera mounted therein and a calibration unit having a reference object with a known full reflectance spectrum of a surface mounted therein, the method comprising:
Dependencies are inferred from the claim text.