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US 2016/0104772 A1Published application
Method of making a semiconductor device using a dummy gate
AssigneeSTMicroelectronics S.r.l.
InventorsNicolas Loubet, Prasanna Khare
Life of this patent
Estimating the term…
Abstract
A method of making a semiconductor device includes forming a fin mask layer on a semiconductor layer, forming a dummy gate over the fin mask layer, and forming source and drain regions on opposite sides of the dummy gate. The dummy gate is removed and the underlying fin mask layer is used to define a plurality of fins in the semiconductor layer. A gate is formed over the plurality of fins.
Claims22
A method of making a semiconductor device comprising:
- forming a fin mask layer on a semiconductor layer;
- forming a dummy gate over the fin mask layer;
- forming source and drain regions on opposite sides of the dummy gate;
- removing the dummy gate and using the underlying fin mask layer to define a plurality of fins in the semiconductor layer;
- and
- forming a gate over the plurality of fins.
3 more elements
A method for making a semiconductor device comprising:
- forming a fin mask layer on a semiconductor layer;
- forming a dummy gate over a portion of the fin mask layer so that portions of the fin mask layer extend outwardly therefrom;
- forming a dummy gate mask layer over the dummy gate;
- removing the portions of the fin mask layer that extend outwardly from the dummy gate using the dummy gate mask layer;
- removing upper portions of the semiconductor layer on opposite sides of the dummy gate to define source and drain recesses;
- forming source and drain regions in the source and drain recesses;
- removing the dummy gate mask layer and the dummy gate and using the underlying fin mask layer to define a plurality of fins in the semiconductor layer;
- and
- forming a gate over the plurality of fins.
6 more elements
17-21. (canceled)
A method of making a semiconductor device comprising:
- forming a fin mask layer on a semiconductor layer;
- forming a dummy gate over the fin mask layer;
- forming source and drain regions on opposite sides of the dummy gate;
- removing the dummy gate and using the underlying fin mask layer to define a plurality of fins in the semiconductor layer;
- and
- forming a gate over the plurality of fins so as not to extend past opposing first and second ends of the plurality of fins.
3 more elements
Dependencies are inferred from the claim text.