Imaging device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsAtsushi HIROSE, Yoshiyuki KUROKAWA, Takayuki IKEDA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsAtsushi HIROSE, Yoshiyuki KUROKAWA, Takayuki IKEDA
Estimating the term…
To provide an imaging device in which incident light can be converted into an appropriate electric signal. The imaging device includes a photoelectric conversion element, a first transistor, a second transistor, a third transistor, and a fourth transistor. One of a source electrode and a drain electrode of the first transistor and one electrode of the photoelectric conversion element have an electrical connection portion in a first opening provided in an insulating layer positioned between the one of the source electrode and the drain electrode of the first transistor and the one electrode of the photoelectric conversion element. The number of the first opening is one in a region where the one of the source electrode and the drain electrode of the first transistor overlaps with the one electrode of the photoelectric conversion element.
An imaging device comprising a photoelectric conversion element, a first transistor, a second transistor, and a first insulating layer provided between the first transistor and the photoelectric conversion element,
An imaging device comprising a photoelectric conversion element, a first transistor, a second transistor, and a first insulating layer,
Dependencies are inferred from the claim text.