Method of use time management for semiconductor device and semiconductor device including use time managing circuit

A use time managing method of a semiconductor device, comprising:

• monitoring accumulated operation time of the semiconductor device by nonvolatilely updating cumulative use time of the semiconductor device in units of preset time periods during an operation of the semiconductor device;
• reading the cumulative use time of the semiconductor device to check whether the cumulative use time has reached a reference time value;
• generating adjusting information when the cumulative use time reaches the reference time value;
• and
• adjusting an operation of an internal circuit of the semiconductor device based on the adjusting information.

A semiconductor device comprising:

• a measuring circuit configured to measure accumulated operation time of the semiconductor device by generating a plurality of storage activation signals, each corresponding to a predetermined amount of operation time of the semiconductor device;
• a storage circuit configured to cumulatively store data indicating occurrences of the generated storage activation signals;
• and
• a read circuit configured to read the cumulatively stored data such that use time of the semiconductor device is detected.