Microscope system
AssigneeOlympus Corporation
InventorsShingo SUZUKI, Takuma KIMURA, Makio UENO
Life of this patent
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Abstract
A microscope system according to the present invention includes a laser light source, a plurality of laser microscopes, and an optical path switching unit that is provided between the laser light source and the laser microscopes and switches a supply destination of a laser beam among the plurality of laser microscopes by changing a beam splitter to be arranged on an incident optical axis, in which each of the laser microscopes includes an optical axis adjustment unit that adjusts an optical axis of the laser beam, and a control unit that controls the optical axis adjustment unit based on identification information about the beam splitter arranged on the incident optical axis.
Claims19
A microscope system comprising:
- a laser light source that outputs a laser beam;
- a plurality of laser microscopes;
- and
- an optical path switching unit that is provided between the laser light source and the plurality of laser microscopes and switches an optical path of the laser beam output from the laser light source among a plurality of optical paths respectively directed toward the plurality of laser microscopes,
- wherein the optical path switching unit includes a plurality of beam splitters that respectively distribute the incident laser beam among the plurality of optical paths in different distribution ratios, and can switch the laser microscope to which the laser beam is supplied by changing the beam splitter to be arranged on the incident optical axis of the laser beam from the laser light source, and
- each of the plurality of laser microscopes includes
- an optical axis adjustment unit that adjusts the optical axis of the laser beam supplied from the optical path switching unit, and
- a control unit that acquires identification information about the beam splitter arranged on the incident optical axis from the optical path switching unit and controls the optical axis adjustment unit based on the acquired identification information.
A microscope system comprising:
- a laser light source that generates a laser beam;
- a plurality of laser microscopes;
- and
- an optical path switching unit that is provided between the plurality of laser microscopes and the laser light source and distributes the laser beam emitted from the laser light source among the laser microscopes,
- wherein the optical path switching unit includes a plurality of beam splitters respectively having different distribution ratios for the laser beam, and can switch the laser microscope to which the laser beam is supplied by changing the beam splitter to be arranged on the optical path of the laser beam from the laser light source, and
- each of the plurality of laser microscopes includes
- an optical axis shift detection unit that detects an amount of shift in the optical axis of the laser beam supplied from the optical path switching unit from the optical axis of the laser microscope based on a position of incidence of the laser beam,
- a light adjustment unit that can adjust an amount of the laser beam to be incident on the optical axis shift detection unit,
- an optical axis adjustment unit that corrects a shift in the optical axis of the laser beam supplied from the optical path switching unit, and
- a control unit that controls the optical axis adjustment unit based on the amount of shift in the optical axis of the laser beam detected by the optical axis shift detection unit after the light adjustment unit restricts an amount of incidence of the laser beam within a predetermined range.
A microscope system comprising:
- a laser light source that generates a laser beam;
- a plurality of laser microscopes;
- and
- an optical path switching unit that is provided between the plurality of laser microscopes and the laser light source and distributes the laser beam emitted from the laser light source among the laser microscopes,
- wherein the optical path switching unit includes a plurality of beam splitters respectively having different distribution ratios for the laser beam, and can switch the laser microscope to which the laser beam is supplied by changing the beam splitter to be arranged on the optical path of the laser beam from the laser light source, and
- each of the plurality of laser microscopes includes
- an optical axis shift detection unit that detects an amount of shift in the optical axis of the laser beam supplied from the optical path switching unit from the optical axis of the laser microscope based on a position of incidence of the laser beam,
- an optical axis adjustment unit that can correct a shift in the optical axis of the laser beam supplied from the optical path switching unit, and
- a control unit that acquires the distribution ratio of the beam splitter arranged on an optical path of the laser beam and controls a sensitivity of the optical axis shift detection unit so that a signal level of the laser beam incident on the optical axis shift detection unit falls within a predetermined range based on the acquired distribution ratio while controlling the optical axis adjustment unit based on the amount of shift in the optical axis of the laser beam detected by the optical axis shift detection unit the sensitivity of which has been controlled.
Dependencies are inferred from the claim text.