Method of inspecting quality of organic light-emitting diode and inspecting system for performing the method
AssigneesSamsung Display Co., Ltd., Korea University Research and Business Foundation
InventorsJung-Jin Yang, Won-Jun Song, Mun-Chae Yoon, Gyu-Tae Kim, Tae-Woong Yoon
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Abstract
A method of inspecting the quality of an organic light-emitting diode (OLED) and an inspecting system for performing the method are disclosed. In one aspect, the method includes applying an input voltage to the OLED, measuring an OLED voltage across the OLED and an OLED current flowing through the OLED, estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current, and extracting a physical characteristic of the OLED based at least in part on the parameter.
Claims22
A method of inspecting the quality of an organic light-emitting diode (OLED), the method comprising:
- applying an input voltage to the OLED;
- measuring an OLED voltage across the OLED and an OLED current flowing through the OLED;
- estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current;
- and
- extracting a physical characteristic of the OLED based at least in part on the parameter.
An inspecting system of an organic light-emitting diode (OLED), the inspecting system comprising:
- a load resistor electrically connected to the OLED in series;
- a data collector configured to apply an input voltage to the OLED and measure at least one of an OLED voltage across the OLED and an OLED current flowing through the OLED;
- and
- a processor configured to i) estimate a parameter of the OLED based at least in part on the OLED voltage and the OLED current and ii) extract a physical characteristic of the based at least in part on the parameter.
Dependencies are inferred from the claim text.