System and method for measurement of s-parameters and dispersion and providing a blended solution of both
AssigneeKeysight Technologies, Inc.
InventorBogdan Szafraniec
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorBogdan Szafraniec
Estimating the term…
A system includes a test signal generator generating a test signal having a carrier and at least two sidebands, and provides the test signal to a device under test (DUT). A plurality of couplers sense an incident signal, a reflected signal, and a transmitted signal for the DUT at corresponding test ports of the test system when the test signal is supplied to the DUT. A signal processing apparatus: detects S-parameters for the DUT from the carrier present in each of the incident signal, reflected signal, and transmitted signal for the device under test; measures a dispersion for the DUT at each of the test ports from the two sidebands present in the incident signal, reflected signal, and transmitted signal for the device under test using the two frequencies; and combines the detected S-parameters and the measured dispersions to output enhanced measurements of the S-parameters and the dispersions.
A system, comprising:
A method, comprising:
An apparatus, comprising:
A method of generating a test signal, the method comprising:
Dependencies are inferred from the claim text.