Testing apparatus
AssigneeSilicon Motion, Inc.
InventorHua-An YANG
Life of this patent
Estimating the term…
Abstract
A test apparatus for testing a first flash memory chip is provided. The testing apparatus includes: an interface printed circuit board (PCB), a separate PCB, and a socket device. The separate PCB is disposed over the interface PCB, and a second flash chip is placed between the interface PCB and the separate PCB. The second flash memory chip includes a first embedded flash chip and a dynamic random access memory (DRAM), and the second flash memory chip is connected to the interface PCB through corresponding first pins of the DRAM. The socket device is disposed over the separate PCB and is configured to install the first flash memory chip. The first flash memory chip is connected to the interface PCB through corresponding second pins.
Claims8
A testing apparatus for testing a first flash memory chip, the testing apparatus comprising:
- an interface printed circuit board (PCB);
- a separate PCB, disposed over the interface PCB, wherein a second flash chip is placed between the interface PCB and the separate PCB, and the second flash memory chip comprises a first embedded flash chip and a dynamic random access memory (DRAM), wherein the second flash memory chip is connected to the interface PCB through corresponding first pins of the DRAM;
- and
- a socket device, disposed over the separate PCB and configured to install the first flash memory chip, wherein the first flash memory chip is connected to the interface PCB through corresponding second pins.
Dependencies are inferred from the claim text.