A method and an apparatus for obtaining sample specific signatures
AssigneeIndian Institute of Science
InventorsSiva UMAPATHY, Sanchita SIL, John KIRAN
Life of this patent
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Abstract
The invention provides a method for obtaining sample specific signatures. The method comprises of irradiating the sample at a predefined location with an electromagnetic radiation of specific wavelength; selectively capturing a certain component of the scattered electromagnetic radiation to obtain a plurality of profiles; and filtering the profiles to obtain a sample specific signature. The invention provides an apparatus for obtaining sample specific signatures.
Claims14
A method for obtaining sample specific signatures, the method comprising:
- irradiating the sample at a predefined location with an electromagnetic radiation of specific wavelength selectively capturing a certain component of the scattered electromagnetic radiation to obtain a plurality of profiles;
- and
- filtering the profiles to obtain a sample specific signature.
An apparatus for detection of sample specific signatures, the system comprising:
- at least one electromagnetic radiation source;
- a first arrangement for directing the electromagnetic radiation onto the sample;
- a second arrangement for collecting the scattered electromagnetic radiation from the sample;
- a spectrum analyzer operably coupled to the second arrangement;
- and
- a detector connected to the optical spectrum analyzer.
Dependencies are inferred from the claim text.