US 2016/0102960 A1 · MEASURING DEVICE AND RELATED METHODS

Abstract

A measuring device and related methods include, in at least one aspect, a method for controlling a measuring device: including processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate a first queue; instructing the measuring device to move at least one of one or more probes to each position listed in the first queue, and to take a surface touch measurement at each position; calculating a set of suitable edge touch positions based on the surface touch measurements, the set of suitable edge touch positions being used to generate a second queue of measurements; and instructing the measuring device to move the at least one of the one or more probes to each position listed in the second queue, and to take an edge measurement at each position.

Claims17

Dependent claims

A measuring device arranged to take measurements of a part using one or more probes which are controlled to contact the part at positions, wherein two or more queues of measurement positions are used to control the position of the one or more probes, the queues comprising:

a first queue comprising positions at which surface touch measurements are to be performed, wherein each surface touch measurement is performed by moving at least one of the one or more probes into contact with a surface of the part;
and
a second queue comprising positions at which edge measurements are to be performed, wherein each edge measurement is performed by moving at least one of the one or more probes into contact with an edge region of the part;
and wherein the measuring device is arranged to:
(i) process the first queue, comprising surface touch measurement positions;
(ii) move at least one of the one or more probes to each position listed in the first queue, taking a surface touch measurement at each position to generate surface touch measurement data;
(iii) process the second queue, comprising edge measurement positions;
and
(iv) move at least one of the one or more probes to each position listed in the second queue, taking an edge measurement at each position to generate edge measurement data.

6 more elements

A computer-implemented method of generating a path for a measuring device to take measurements of a part using one or more probes which are controlled to touch the part at positions, wherein two or more queues of measurement positions are used to control the position of the one or more probes, the queues comprising:

a first queue comprising positions at which surface touch measurements are to be performed, wherein each surface touch measurement is performed by moving at least one of the one or more probes into contact with a surface of the part;
and
a second queue comprising positions at which edge measurements are to be performed, wherein each edge measurement is performed by moving at least one of the one or more probes into contact with an edge region of the part;
wherein the method comprises:
(i) processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate the first queue;
and
(ii) processing surface touch measurement data corresponding to the first queue to determine a set of suitable edge touch positions, the set of suitable edge touch positions being used to generate the second queue of measurements.

4 more elements

Dependencies are inferred from the claim text.

Measuring device and related methods

Life of this patent

Measuring device and related methods

Life of this patent

Abstract

Claims17