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US 2016/0101318 A1Published application
Swing group analysis apparatus, swing group analysis method, and swing group analysis program
AssigneeSeiko Epson Corporation
InventorsNobuyuki KITO, Takuya NAKAYAMA
Life of this patent
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Abstract
A swing group analysis apparatus includes a swing analysis unit which calculates an analytical value of a specific item for a swing which belong to a swing group based on an output of an inertia sensor; and an evaluation unit which evaluates the swing group by comparing a set target value and the analytical value.
Claims14
A swing group analysis apparatus comprising:
- a swing analysis unit which calculates an analytical value of a specific item for a swing which belong to a swing group based on an output of an inertia sensor;
- and
- an evaluation unit which evaluates the swing group by comparing a set target value and the analytical value.
A swing group analysis method comprising:
- calculating an analytical value of a specific item for a swing which belong to a swing group based on an output of an inertia sensor;
- and
- evaluating the swing group by comparing a set target value and the analytical value.
Dependencies are inferred from the claim text.