Brain dysfunction assessment method, brain dysfunction assessment device, and program thereof
AssigneeHitachi Maxell, Ltd.
InventorsYuko SANO, Akihiko KANDORI, Kanako ESAKI, Kazuhiro KAIZAKI, Shinya KATSUKI, Kenji KATSUMATA, Tomohiko MIZUGUCHI, Yasushi SAITO, Tamotsu NAGABAYASHI, Tomochika YAMASHITA, Takumi OKAMURA
Life of this patent
Estimating the term…