Extensible meta model for capturing solution patterns
AssigneeInternational Business Machines Corporation
InventorsVadim Berestetsky, Allen V. Chan, Suman K. Kalia, Peter A. Lambros, Stephen Rea
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AssigneeInternational Business Machines Corporation
InventorsVadim Berestetsky, Allen V. Chan, Suman K. Kalia, Peter A. Lambros, Stephen Rea
Estimating the term…
A method for capturing patterns and associated points of variability includes providing an XML schema defining elements representing different point of variability (POV) types for a pattern. The elements belong to an XML schema “substitution group” to enable the POV types to be substituted for one another. In selected embodiments, the method enables a pattern author to add new or custom POV types to the “substitution group,” thereby allowing the pattern author to extend the pattern meta model to include new POV types. Once the desired POV types are defined, the method enables the pattern author to generate an instance of the XML schema, defining the points of variability for a specific pattern, using the elements defined in the XML schema “substitution group.” A corresponding apparatus and computer program product are also disclosed and claimed herein.
A computer-implemented method, comprising:
An apparatus, comprising:
A computer program product comprising a non-transitory computer-readable medium having computer-usable program code embodied therein, where the computer-usable program code when executed on a computer causes the computer to:
Dependencies are inferred from the claim text.