Built in test circuit for transient voltage suppressor devices
AssigneeHamilton Sundstrand Corporation
InventorsJames Quigley, Gary L. Hess
Life of this patent
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Abstract
A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.
Claims15
A built-in test system comprising:
- a control circuit configured to receive a first signal;
- a first transient voltage suppressor circuit comprising first and second transient voltage suppressors connected in series between the first signal and ground;
- and
- a test switch connected to selectively conduct current between the first signal and a first node between the first and second transient voltage suppressors, wherein the control circuit is configured to control the test switch to test the first and second transient voltage suppressors.
A method comprising:
- controlling, by a control circuit, a test switch to an OFF state to deny current from a first signal to a first node between first and second transient voltage suppressors, wherein the first and second transient voltage suppressors are connected in series between the first signal and ground;
- sampling, by the control circuit, a first sample voltage value at the first node;
- controlling, by the control circuit, the test switch to an ON state to conduct current from the first signal to the first node;
- sampling, by the control circuit, a second sample voltage value at the first node;
- and
- verifying, by the control circuit, functionality of the first and second transient voltage suppressors based upon the first and second sample voltages values.
Dependencies are inferred from the claim text.