Semiconductor device, and resistance measuring system and pressure instrumentation device each including the semiconductor device
AssigneeRenesas Electronics Corporation
InventorsMasato HIRAI, Siewling LIM
Life of this patent
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AssigneeRenesas Electronics Corporation
InventorsMasato HIRAI, Siewling LIM
Estimating the term…
According to one embodiment, a semiconductor device 1 includes: a variable current generating unit 11 that sends a direct current Idac of a value according to a control signal S1 from one measurement node of a bridge circuit B1 in which a change amount ΔR4 of a resistance value of a pressure-sensitive resistance element R4 appears as a potential difference ΔV between measurement nodes NA, NB; a potential difference determining unit 12 that determines whether or not the potential difference ΔV has been generated; and a control unit 13 that outputs the control signal S1 to the variable current generating unit 11 so that the variable current generating unit 11 sends the direct current Idac of a value that does not generate the potential difference ΔV based on a determination result D1 of the potential difference determining unit 12.
A semiconductor device comprising:
Dependencies are inferred from the claim text.