Method of evaluating quality of vision in examinee's eye and storage medium
AssigneeNidek Co., Ltd.
InventorKazunari SHIMIZU
Life of this patent
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AssigneeNidek Co., Ltd.
InventorKazunari SHIMIZU
Estimating the term…
An ophthalmic apparatus obtains naked-eye wavefront aberration data of an examinee's eye measured by an aberration measuring unit, and calculates first corrected wavefront aberration data intended for a prescription with a first correction power based on the naked-eye wavefront aberration data and the first correction power and generates a first evaluation index based on the first corrected wavefront aberration data. The ophthalmic apparatus further calculates second corrected wavefront aberration data intended for a prescription with a second correction power different from the first correction power in at least one of spherical power, astigmatic power, and astigmatic axis angle based on the naked-eye wavefront aberration data and the second correction power, and generates a second evaluation index based on the second corrected wavefront aberration data. The ophthalmic apparatus then displays the first and second evaluation indexes selectively or in parallel on a monitor.
A method of evaluating quality of vision in an examinee's eye, comprising:
A method of evaluating quality of vision in an examinee's eye, comprising:
A storage medium storing an ophthalmic measurement program to simulate an evaluation index representing quality of vision in an examinee's eye,
Dependencies are inferred from the claim text.