Systems and methods for frequency domain calibration and characterization
AssigneeIntel Corporation
InventorsCho-Ying Lu, William Yee Li, Khoa Minh Nguyen, Ashoke Ravi, Maneesha Yellepeddi, Binta M. Patel
Life of this patent
Estimating the term…
Loading patent…
AssigneeIntel Corporation
InventorsCho-Ying Lu, William Yee Li, Khoa Minh Nguyen, Ashoke Ravi, Maneesha Yellepeddi, Binta M. Patel
Estimating the term…
A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
A system for assigning a characterization and calibrating a parameter, the system comprising:
A system for assigning a characterization and calibrating components in a phase locked loop, the system comprising:
A method for assigning a characterization and calibrating a component, the method comprising:
Dependencies are inferred from the claim text.